BeiJing，BeiJing-
E-mail
export@timegroup.com.cn
-
Phone
86-10-62966798
- Address
Product Categories
Beijing TIME High Technology Ltd.Free·1YRS
Digital Ultrasonic Flaw Detector TIME®1150
NegotiableUpdate on September 08
- Model
- Nature of the Manufacturer
- Manufacturer
- Product Category
- Place of Origin
- City, Province
Overview
TIME1150 is the best digital ultrasonic flaw detector manufactured by TIME Group Inc.
Product Details
Features
● 5.7 inch, VGA color TFT display and LEMO/BNC probe connector.
● Wide measurement range from 1-10000 mm.
● Precise and stable horizontal and vertical linearity with horizontal linearity 0.1% and vertical linearity 2%.
● DAC, AVG, DGS curves and defect echo help to evaluate defect equivalent calculation.
● Simultaneous display of high resolution A-scan and B-scan waveform.
● Four ways to present waveform: positive half-wave, negative half- wave, full wave and radio frequency.
● Automatic gain adjustment, defect equivalent calculation and peak memory function.
● Two individual gates setting and alarming function.
● Gate measurement includes echo amplitude, beam path, depth, projection and so on.
● Waveform freeze available：in full ,peak, comparative and envelope ways.
● 50 detecting channels are available with separate detecting parameters and DAC (Distance Amplitude Correction) curves in every channel.
● Adjustable high performance square wave pulse generator
● Three detecting modes(single-probe, dual crystal probe and transmission) with automatic calibration function.
● Connected to PC via USB interface with advanced software for data analysis and management.
● Super large memory, 1000 waveform and 4X2000 frame dynamic waveform diagrams can be stored, with the function of storage, checkout and review of channel, waveform, dynamic records.
● Flaw detection report printable.
Standard Delivery |
|
Main unit | 1 |
Lithium battery | 2 |
Power adaptor (3A/9V) | 1 |
LEMO-Q9 Probe connecting cable | 1 |
LEMO-Q6 Probe connecting cable | 1 |
Straight beam probe (φ20 2.5MHz ) | 1 |
Angle beam probe (φ20 2.5MHz ) | 1 |
Coupling agent | 1 |
Necklace belt | 1 |
Wrist belt | 1 |
Time Certificate | 1 |
Warranty card | 1 |
Instruction manual | 1 |
Operating temperature | -10℃~+50℃ |
Storage temperature | -20℃~+60℃ |
Language | English/Chinese/Spanish selectable |
Probe socket | LEMO or BNC |
Battery (mAh) | 2x3.7V 5000mAh |
Battery working time | >8h |
Charging time (h) | <8h |
Power adapter Input | 100-240~50/60Hz |
Output | 9V DC/3A~4A |
LCD | Color transmission TFT, 640x480 |
Dimension (mm) | 177X255X51 |
Weight (g) | 1200 |
Basic | Receiver | ||
Measuring unit | mm/inch/μs | Gain (dB) | 0~110 |
Scanning range (mm) | 0-10000 | Bandwidth (MHz) | 0.5~15 |
Sound velocity (m/s) | 600-16000 | Rectify | Positive half wave, negative half wave, full and RF |
P-delay (μs) | -1.000~750.000 | Vertical linearity accuracy | ±2% |
D-delay (μs) | -20~+3400 | Amplifier resolution (dB) | ±1 |
Test mode | Pulse-echo, dual and through transmission | Rejection (1%) | Linear, 0~80% of the full screen |
Scanning mode | A scan and B scan, displaying both simultaneously | Sampling frequency (MHz) | 80 |
Pulse generator | Crosstalk rejection (dB) | ≥80 | |
Pulser (V) | Square pulse | Dead zone (μs) | ≤10 (related with transmitting) |
Transmitting voltage | 100~400(V) variable in steps of 10V | Dynamic range (dB) | ≥40 |
Transmitting pulse width (ns) | 75/100~500 variable in steps of 50ns | Instant resolution (dB) | ≥32 |
Damping (Ω) | 50/100/200/500 | Time base linearity | <±0.2% full screen |
Pulse repetition frequency (Hz) | 10~1000 | Sensitivity leavings (dB) | ≥62 |
Measurements and others | Data management, communication and print | ||
Gate | 2 indepent gates | Data storage | 50 channels |
Testing position | Edge, Peak value | 1000 wave images (including 980 A scan images and 20 B scan images) | |
Gate measurements | Echo amplitude, Sound path, depth, projection etc. | 4x2000 dynamic wave image | |
Freeze | Freeze waveform, peak value, comparative and envelope | Store, review or replay the channels, waves | |
AVG equivalent calculate | Calculate the flaw equivalent according to the flaw echo and AVG curve | All the data can be stored to PC or flash disk | |
DAC flaw evaluating | Make flaw evaluation according to flaw echo and DAC curve | Communication | Communicate with PC via USB interface |
Gate logic | Off, measurement, gate positive wave alarm, gate negative wave alarm | Printing | Print report |
Gate alarm | off, anytime, hold for 0.2s, 0.5s, 1s and 2s, lock | Outout port | |
Alarm | on/off | USB OTG port | USB 2.0 device connected with PC |
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