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export@timegroup.com.cn
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Beijing TIME High Technology Ltd.Free·1YRS
export@timegroup.com.cn
86-10-62966798
Features
● Two operation principles are adapted: magnetic induction (ferrous) and eddy current (non-ferrous) to take non-destructive measurements
● 6 types of probes are available for different applications
● Features two working modes: DIRECT and BATCH& two measuring ways: CONTINUE and SINGLE
● Statistics include the mean, maximum, minimum, test numbers and standard deviation.
● Memory of 640 data
● Two calibration methods for better correction
● Integrated with printer to print the statists values if needed
● Low battery indication and error alarm
● Backlight for the screen
● Auto or manual shutdown
● Conform to the standards of DIN, ISO, ASTMBS.
Standard Delivery |
|
Main unit | 1 |
Probe | 1 |
Substrate | 1 |
Calibration foil | 1 |
Charger | 1 |
Printing paper | 1 |
TIME certificate | 1 |
Warranty card | 1 |
Instruction manual | 1 |
More information: Applications of Coating Thickness Gauges
Probe types | F | N | |
Measuring methods | magnetic induction | eddy current | |
Measuring range | 0 ~1250 μm | 0 ~1250 μm, 0 to 40μm (for chrome plate on copper) | |
Minimum resolution | 0.1μm | ||
Tolerance | Zero point calibration | ±(3%H+1)μm | ± (3%H+1.5)μm |
H means the thickness of tested piece | |||
Two points calibration | ±[(1~3)%H+1]μm | ±[(1~3)%H+1.5]μm | |
H means the thickness of tested piece | |||
Measuring condition | Min. curvature radius (mm) | Convexity 1.5 | Convexity 3 |
Min. testing area diameter (mm) | Ø7 | Ø5 | |
Critical thickness of substrate(mm) | 0.5 | 0.3 | |
Standards | DIN,ISO,ASTM,BS | ||
Calibration | Zero and foil calibration | ||
Interface | RS232 | ||
Statistic | Number of measurement, mean, standarddeviation, maximum and minimum | ||
Data memory | 640 readings | ||
Limits | Adjustable with alarm | ||
Power | NiMH rechargeable battery | ||
Operating environment | Temperature: 0~40℃ | ||
Humidity: 20%~90% | |||
No strong magnetic field | |||
Dimensions (mm) | 230×86×47 |
Optional Probes and Application Guide
Probe model | F400 | F1 | F1/90º | F10 | N1 | CN02 | |
Operating principle | Magnetic induction | Eddy current | |||||
Measuring range (µm) | 0-400 | 0-1250 | 0-10000 | 0 to 1250 μm | 10~200 | ||
Low range resolution (µm) | 0.1 | 0.1 | 10 | 0.1 | 1 | ||
Accuracy | One-point calibration (µm) | ±(3%H+1) | ±(3%H+10) | ±(3%H+1.5) | ±(3%H+1) | ||
Two-point calibration (µm) | ±[(1~3)H%+0.7] | ±[(1~3)H%+1] | ±[(1~3)%H+10] | ±[(1~3)%H+1.5] | - | ||
Measuring conditions | Min curvature of the min area (mm) | Convex 1 | 1.5 | Flatten | 10 | 3 | Flatten |
Diameter of the min area (mm) | φ3 | φ7 | φ7 | φ40 | φ5 | φ7 | |
Critical thickness of substrate (mm) | 0.2 | 0.5 | 0.5 | 2 | 0.3 | unlimited |